[1] Modarres M., Kaminskiy M. P., and Krivtsov V., Reliability Engineering and Risk Analysis: A Practical Guide: CRC press, 2016.
[2] Duane J., Learning curve approach to reliability monitoring, IEEE Transactions on Aerospace, vol. 2, pp. 563-566, 1964.
[3] Crow L. H., Reliability analysis for complex, repairable systems, Army Material Systems Analysis Activityaberdeen Poving Ground MD, 1975.
[4] Crow L. H, Confidence interval procedures for reliability growth analysis, Army Material Systems Analysis Activityaberdeen Poving Ground MD, 1977.
[5] Ascher H., Comments on" Models for reliability of repaired equipment, IEEE Transactions on Reliability, vol. 28, pp. 119-129, 1979.
[6] Bain L. J. and Engelhardt M., Inferences on the parameters and current system reliability for a time truncated Weibull process, Technometrics, vol. 22, pp. 421-426, 1980.
[7] Bassin W., Increasing hazard functions and overhaul policy, in Proc. 1969 Ann. Symp. Reliability, pp. 173-178, 1969.
[8] Finkelstein J., Confidence bounds on the parameters of the Weibull process, Technometrics, vol. 18, pp. 115-117, 1976.
[9] Lee L. and Lee S. K., Some results on inference for the Weibull process, Technometrics, vol. 20, pp. 41-45, 1978.
[10] Donovan J. and Murphy E., Reliability growth—a new graphical model, Quality and Reliability Engineering International, vol. 15, pp. 167-174, 1999.
[11] Codier E. O., Reliability growth in real life, in Proceedings, 1968 Annual Symposium on Reliability, New York, IEEE, pp. 458-469, 1968.
[12] O'Connor P. and Kleyner A., Practical reliability engineering: John Wiley & Sons, 2012.
[13] Selby J., Reliability Planning and Management-RPM, 1970.
[14] Herd G., Comparisons of reliability growth experience, Reliability Growth Management, Testing, and Modeling, pp. 19-78, 1978.
[15] Jelinski Z. and Moranda P., Software reliability research, in Statistical computer performance evaluation, ed: Elsevier, pp. 465-484, 1972.
[16] Littlewood B., Stochastic reliability-growth: A model for fault-removal in computer-programs and hardware-designs, IEEE Transactions on Reliability, vol. 30, pp. 313-320, 1981.
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